IEEE

Radiation Hardness Assurance Through System-Level Testing: Risk Acceptance, Facility Requirements, Test Methodology, and Data Exploitation

Abstract: Functional verification schemes at a level different from component-level testing are emerging as a cost-effective tool for those space systems for which the risk associated with a lower ...
IEEE

Hardness Assurance for Total Dose and Dose Rate Testing of a State-of-the-Art Off-Shore 32 nm CMOS Processor

Abstract: Hardness assurance test results of an Advanced Micro Devices, Inc. (AMD) 32 nm processor for total dose and dose rate response are presented. Testing was performed using commercial ...