At European Microwave Week 2025, Electronic Specifier's Editor, Mick Elliott speaks to Giorgia Zucchelli, RF and Mixed Signal Product Manager about the solutions supplied by MathWorks that can ...
Abstract: Fault detection and diagnosis (FDD) in smart manufacturing (SM) has become a significant area of research due to its potential impact on safety, robustness, and overall durability. This ...
Abstract: Deep probabilistic learning networks have been applied in industrial soft sensors. However, they face significant challenges in latent variable inference, deep learning backend ...
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