Leverage Functional Interfaces For High-Speed Test Access During All Phases Of The Silicon Lifecycle
Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were ...
After PCI, there is no value to routine functional testing above and beyond standard care in high-risk patients, new data suggest. Doing such follow-up at 1 year had no impact on 2-year clinical ...
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