The latest publication from portable test equipment expert, Megger, provides a compact yet comprehensive guide to the frequently misunderstood subject of oil dielectric breakdown voltage testing. The ...
A research team at Georgia Tech has built what it calls the first generative AI system purpose-built for polymer design, and ...
The JEDEC 35 Standard (EIA/JESD35, Procedure for Wafer-Level Testing of Thin Dielectrics) describes voltage ramp (V-ramp) and current ramp (J-ramp) tests to monitor oxide integrity. These tests are ...