Turkey's benchmark stock index started the week at 1,054.55 points on Monday, down 0.57% or 6.05 points. At Friday's close, Borsa Istanbul's BIST 100 index was up by 2.53% at 1,060.59 points with a ...
Design-for-test (DFT) engineers often struggle to develop a memory built-in self-test (BIST) grouping plan, deciding which memories belong to which BIST group, to improve test time, routing effort, ...
For almost 20 years, researchers and semiconductormanufacturers have been trying to developa practical analog BIST (built-in self-test) formixed-signal ICs. By enabling mixed-signal ICtesting on ...
The persistent growth of mobile computing is driving an increasing need to manage power consumption within semiconductor devices. This has significant implications on the design and test of these ...
Atlantic City, NJ, (September 28, 1999) -- Genesys Testware, Inc. today announced the addition of multi-frequency built-in at-speed testing capability to its Logic BistCore TM product to reduce defect ...
Achieving Gigabit data rates is a challenge that can excite the imagination of chip designers. An equally significant challenge is making these designs testable, but somehow designers don't get ...
Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback